IONIZATION RATES OF HOLES + ELECTRONS IN SILICON

被引:357
作者
LEE, CA
KLEIMACK, JJ
BATDORF, RL
WIEGMANN, W
LOGAN, RA
机构
来源
PHYSICAL REVIEW | 1964年 / 134卷 / 3A期
关键词
D O I
10.1103/PhysRev.134.A761
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:A761 / +
相关论文
共 26 条
[1]   DISTRIBUTION FUNCTIONS AND IONIZATION RATES FOR HOT ELECTRONS IN SEMICONDUCTORS [J].
BARAFF, GA .
PHYSICAL REVIEW, 1962, 128 (06) :2507-&
[2]   HOT-ELECTRON EMISSION FROM SHALLO P-N JUNCTIONS IN SILICON [J].
BARTELINK, D ;
MOLL, JL ;
MEYER, NI .
PHYSICAL REVIEW, 1963, 130 (03) :972-+
[3]   UNIFORM SILICON P-N JUNCTIONS .1. BROAD AREA BREAKDOWN [J].
BATDORF, RL ;
CHYNOWETH, AG ;
DACEY, GC ;
FOY, PW .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (07) :1153-1160
[4]   DIFFUSION OF IMPURITIES INTO EVAPORATING SILICON [J].
BATDORF, RL ;
SMITS, FM .
JOURNAL OF APPLIED PHYSICS, 1959, 30 (02) :259-264
[5]   LATTICE VIBRATIONS IN SILICON AND GERMANIUM [J].
BROCKHOUSE, BN .
PHYSICAL REVIEW LETTERS, 1959, 2 (06) :256-258
[6]   UNIFORM SILICON P-N JUNCTIONS .2. IONIZATION RATES FOR ELECTRONS [J].
CHYNOWETH, AG .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (07) :1161-1165
[7]   IONIZATION RATES FOR ELECTRONS AND HOLES IN SILICON [J].
CHYNOWETH, AG .
PHYSICAL REVIEW, 1958, 109 (05) :1537-1540
[8]   AVALANCHE EFFECTS IN SILICON P-N JUNCTIONS .2. STRUCTURALLY PERFECT JUNCTIONS [J].
GOETZBERGER, A ;
SCARLETT, RM ;
HAITZ, RH ;
MCDONALD, B .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (06) :1591-+
[9]  
HOWARD NR, 1962, J ELECTRON CONTR, V13, P537
[10]   ANOMALOUS IMPURITY DIFFUSION IN EPITAXIAL SILICON NEAR THE SUBSTRATE [J].
KAHNG, D ;
THOMAS, CO ;
MANZ, RC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1962, 109 (11) :1106-1108