O-16 CONTAMINATION IN HE-4 ANALYSIS BEAMS

被引：10

作者：

PICRAUX, ST ^{[1
]}

BORDERS, JA ^{[1
]}

LANGLEY, RA ^{[1
]}

机构：

[1] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

THIN SOLID FILMS | 1973年 / 19卷 / 02期

关键词：

D O I：

10.1016/0040-6090(73)90073-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：371 / 380

页数：10

共 9 条

[1]

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[2]

BRACKMAN RT, 1968, TR6896 AIR FORC WEAP

[3] RADIATION BLISTERING OF POLYCRYSTALLINE NIOBIUM BY HELIUM-ION IMPLANTATION [J].

DAS, SK ;

KAMINSKY, M .

JOURNAL OF APPLIED PHYSICS, 1973, 44 (01) :25-31

[4]

DMITRIEV IS, 1962, SOV PHYS JETP-USSR, V15, P11

[5] COMBINED USE OF HE BACKSCATTERING AND HE-INDUCED X-RAYS IN STUDY OF ANODICALLY GROWN OXIDE-FILMS ON GAAS [J].

FELDMAN, LC ;

POATE, JM ;

ERMANIS, F ;

SCHWARTZ, B .

THIN SOLID FILMS, 1973, 19 (01) :81-89

[6] OBSERVATIONS ON BAYARD-ALPERT ION GAUGE SENSITIVITIES TO VARIOUS GASES [J].

FLAIM, TA ;

OWNBY, PD .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (05) :661-&

[7] COMPARISON OF SURFACE-LAYER ANALYSIS TECHNIQUES [J].

MAYER, JW ;

TUROS, A .

THIN SOLID FILMS, 1973, 19 (01) :1-10

[8]

Mayer JW., 1972, RADIAT EFF DEFECT S, V12, P183, DOI [10.1080/00337577208231141, DOI 10.1080/00337577208231141]

[9]

MITCHELL IV, 1972, PERSONAL COMMUNICATI

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