HIGH-RESOLUTION POSITRON EMISSION TOMOGRAPHY USING SMALL BISMUTH-GERMANATE CRYSTALS AND INDIVIDUAL PHOTOSENSORS

被引:34
作者
DERENZO, SE [1 ]
BUDINGER, TF [1 ]
VULETICH, T [1 ]
机构
[1] UNIV CALIF BERKELEY,DONNER LAB,BERKELEY,CA 94720
关键词
D O I
10.1109/TNS.1983.4332351
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:665 / 670
页数:6
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