STRUCTURAL AND ELECTRICAL CHARACTERISTICS OF PLATINUM-SILICIDE-SILICON CONTACTS AS INFLUENCED BY SPUTTER ETCHING AND ANNEALING AMBIENT

被引:11
作者
SEVERI, M [1 ]
GABILLI, E [1 ]
GUERRI, S [1 ]
CELOTTI, G [1 ]
机构
[1] CNR, LAMEL LAB, I-40126 BOLOGNA, ITALY
关键词
D O I
10.1063/1.323908
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1998 / 2003
页数:6
相关论文
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