共 5 条
[2]
Electronic circuit reliability modeling
[J].
MICROELECTRONICS RELIABILITY,
2006, 46 (12)
:1957-1979
[4]
Solder joint fatigue models: review and applicability to chip scale packages[J] . W.W Lee,L.T Nguyen,G.S Selvaduray.Microelectronics Reliability . 2000 (2)
[5]
Influence of selected design variables on thermo-mechanical stress distributions in plated-through-hole structures .2 Bhandarkar,S.M,Dasgupta,A,Barker,D,Pecht,M,Englemaier,W. Journal of Electronic Packaging, Transactions of the ASME . 1992