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ELIMINATION OF O-16(2+) EFFECT IN BACKSCATTERING STUDIES OF THIN-FILM REACTIONS
被引:4
作者
:
LIU, YC
论文数:
0
引用数:
0
h-index:
0
机构:
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
LIU, YC
[
1
]
CHOU, CF
论文数:
0
引用数:
0
h-index:
0
机构:
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
CHOU, CF
[
1
]
MAA, JS
论文数:
0
引用数:
0
h-index:
0
机构:
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
MAA, JS
[
1
]
机构
:
[1]
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
来源
:
THIN SOLID FILMS
|
1977年
/ 47卷
/ 03期
关键词
:
D O I
:
10.1016/0040-6090(77)90052-9
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:L5 / L7
页数:3
相关论文
共 5 条
[1]
EFFECT OF POOR VACUUM CONDITIONS ON ANALYSIS OF THIN-FILMS BY RUTHERFORD BACKSCATTERING
[J].
HEMMENT, PLF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
HEMMENT, PLF
;
SINGLETON, JF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
SINGLETON, JF
;
STEPHENS, KG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
STEPHENS, KG
.
THIN SOLID FILMS,
1975,
28
(01)
:L1
-L4
[2]
LOW-TEMPERATURE MIGRATION OF SILICON IN THIN LAYERS OF GOLD AND PLATINUM
[J].
HIRAKI, A
论文数:
0
引用数:
0
h-index:
0
HIRAKI, A
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
NICOLET, MA
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
.
APPLIED PHYSICS LETTERS,
1971,
18
(05)
:178
-&
[3]
KINETICS OF SILICIDE FORMATION BY THIN-FILMS OF V ON SI AND SIO2 SUBSTRATES
[J].
KRAUTLE, H
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
CALTECH,PASADENA,CA 91109
KRAUTLE, H
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
CALTECH,PASADENA,CA 91109
NICOLET, MA
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
CALTECH,PASADENA,CA 91109
MAYER, JW
.
JOURNAL OF APPLIED PHYSICS,
1974,
45
(08)
:3304
-3308
[4]
O-16 CONTAMINATION IN HE-4 ANALYSIS BEAMS
[J].
PICRAUX, ST
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
PICRAUX, ST
;
BORDERS, JA
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
BORDERS, JA
;
LANGLEY, RA
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
LANGLEY, RA
.
THIN SOLID FILMS,
1973,
19
(02)
:371
-380
[5]
ZIEGLER JF, 1975, NEW USES ION ACCELER
←
1
→
共 5 条
[1]
EFFECT OF POOR VACUUM CONDITIONS ON ANALYSIS OF THIN-FILMS BY RUTHERFORD BACKSCATTERING
[J].
HEMMENT, PLF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
HEMMENT, PLF
;
SINGLETON, JF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
SINGLETON, JF
;
STEPHENS, KG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD,SURREY,ENGLAND
STEPHENS, KG
.
THIN SOLID FILMS,
1975,
28
(01)
:L1
-L4
[2]
LOW-TEMPERATURE MIGRATION OF SILICON IN THIN LAYERS OF GOLD AND PLATINUM
[J].
HIRAKI, A
论文数:
0
引用数:
0
h-index:
0
HIRAKI, A
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
NICOLET, MA
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
.
APPLIED PHYSICS LETTERS,
1971,
18
(05)
:178
-&
[3]
KINETICS OF SILICIDE FORMATION BY THIN-FILMS OF V ON SI AND SIO2 SUBSTRATES
[J].
KRAUTLE, H
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
CALTECH,PASADENA,CA 91109
KRAUTLE, H
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
CALTECH,PASADENA,CA 91109
NICOLET, MA
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
CALTECH,PASADENA,CA 91109
MAYER, JW
.
JOURNAL OF APPLIED PHYSICS,
1974,
45
(08)
:3304
-3308
[4]
O-16 CONTAMINATION IN HE-4 ANALYSIS BEAMS
[J].
PICRAUX, ST
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
PICRAUX, ST
;
BORDERS, JA
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
BORDERS, JA
;
LANGLEY, RA
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
LANGLEY, RA
.
THIN SOLID FILMS,
1973,
19
(02)
:371
-380
[5]
ZIEGLER JF, 1975, NEW USES ION ACCELER
←
1
→