MEASUREMENT AND COMPENSATION OF DEFOCUSING AND ABERRATIONS BY FOURIER PROCESSING OF ELECTRON MICROGRAPHS

被引:312
作者
ERICKSON, HP
KLUG, A
机构
关键词
D O I
10.1098/rstb.1971.0040
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
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页码:105 / &
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