TIP-FORCE INDUCED SURFACE DEFORMATION IN THE LAYERED COMMENSURATE TELLURIDES NBA(X)TE(2) (A=SI, GE) DURING ATOMIC-FORCE MICROSCOPY MEASUREMENTS

被引:24
作者
BENGEL, H
CANTOW, HJ
MAGONOV, SN
MONCONDUIT, L
EVAIN, M
WHANGBO, MH
机构
[1] N CAROLINA STATE UNIV,DEPT CHEM,RALEIGH,NC 27695
[2] UNIV FREIBURG,CTR MAT RES,D-79104 FREIBURG,GERMANY
[3] UNIV NANTES,INST MAT NANTES,CHIM SOLIDES LAB,F-44072 NANTES 03,FRANCE
关键词
ATOMIC FORCE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; MORPHOLOGY; ROUGHNESS; AND TOPOGRAPHY; SURFACE RELAXATION AND RECONSTRUCTION; TELLURIDES;
D O I
10.1016/0039-6028(94)90170-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The Te-atom surfaces of commensurate layered tellurides NbA(x)Te(2) (A = Si, x = 1/2; A = Ge, x = 1/3, 2/5, 3/7) were examined by atomic force microscopy (AFM) at different applied forces. Although the bulk crystal structures show a negligible height corrugation in the surface Te-atom sheets, the AFM images exhibit dark linear patterns that become strongly pronounced at high applied forces (several hundreds nN). This feature comes about because the tip-sample force interactions induce a surface corrugation according to the local hardness variation of the surface.
引用
收藏
页码:L170 / L176
页数:7
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