TIP-FORCE INDUCED SURFACE DEFORMATION IN THE LAYERED COMMENSURATE TELLURIDES NBA(X)TE(2) (A=SI, GE) DURING ATOMIC-FORCE MICROSCOPY MEASUREMENTS

被引：24

作者：

BENGEL, H

CANTOW, HJ

MAGONOV, SN

MONCONDUIT, L

EVAIN, M

WHANGBO, MH

机构：

[1] N CAROLINA STATE UNIV,DEPT CHEM,RALEIGH,NC 27695

[2] UNIV FREIBURG,CTR MAT RES,D-79104 FREIBURG,GERMANY

[3] UNIV NANTES,INST MAT NANTES,CHIM SOLIDES LAB,F-44072 NANTES 03,FRANCE

来源：

SURFACE SCIENCE | 1994年 / 321卷 / 03期

关键词：

ATOMIC FORCE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; MORPHOLOGY; ROUGHNESS; AND TOPOGRAPHY; SURFACE RELAXATION AND RECONSTRUCTION; TELLURIDES;

D O I：

10.1016/0039-6028(94)90170-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The Te-atom surfaces of commensurate layered tellurides NbA(x)Te(2) (A = Si, x = 1/2; A = Ge, x = 1/3, 2/5, 3/7) were examined by atomic force microscopy (AFM) at different applied forces. Although the bulk crystal structures show a negligible height corrugation in the surface Te-atom sheets, the AFM images exhibit dark linear patterns that become strongly pronounced at high applied forces (several hundreds nN). This feature comes about because the tip-sample force interactions induce a surface corrugation according to the local hardness variation of the surface.

引用

页码：L170 / L176

页数：7

共 17 条

[1] MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].