EVIDENCE OF SIO AT THE SI-OXIDE INTERFACE BY SURFACE SOFT-X-RAY ABSORPTION NEAR EDGE SPECTROSCOPY

被引：71

作者：

BIANCONI, A

机构：

[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

[2] UNIV CAMERINO,I-62032 CAMERINO,ITALY

[3] LAB NAZL FRASCATI,PULS,I-00044 FRASCATI,ITALY

来源：

SURFACE SCIENCE | 1980年 / 99卷 / 01期

关键词：

D O I：

10.1016/0039-6028(80)90578-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：76 / 86

页数：11

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