SINGLE-CRYSTAL DIFFRACTOMETRY - IMPROVEMENT OF ACCURACY IN INTENSITY MEASUREMENTS

被引：99

作者：

ALEXANDER, LE

SMITH, GS

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1964年 / 17卷 / 10期

关键词：

D O I：

10.1107/S0365110X64003115

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1195 / &

共 12 条

[1] DETERMINATION OF INHERENT REFLECTING RANGE OF A SINGLE CRYSTAL IN DIFFRACTOMETRY [J].

ALEXANDER, LE ;

BROWN, PE ;

SMITH, GS .

ACTA CRYSTALLOGRAPHICA, 1963, 16 (08) :773-&

[2] RECEIVING APERTURE WIDTHS IN SINGLE-CRYSTAL DIFFRACTOMETRY [J].

ALEXANDER, LE ;

SMITH, GS .

ACTA CRYSTALLOGRAPHICA, 1964, 17 (04) :447-&

[3] SINGLE-CRYSTAL INTENSITY MEASUREMENTS WITH 3-CIRCLE COUNTER DIFFRACTOMETER [J].

ALEXANDER, LE ;

SMITH, GS .

ACTA CRYSTALLOGRAPHICA, 1962, 15 (OCT) :983-&

[4] COMPARISON OF OMEGA + 2THETA SCANS FOR INTEGRATED INTENSITY MEASUREMENT [J].

BURBANK, RD .

ACTA CRYSTALLOGRAPHICA, 1964, 17 (04) :434-&

[5]

FISCHER K, 1961, Z KRISTALLOGR, V116, P27

[6] APPARATUS FOR MEASURING COMPLETE SINGLE-CRYSTAL X-RAY DIFFRACTION DATA BY MEANS OF A GEIGER COUNTER DIFFRACTOMETER [J].

FURNAS, TC ;

HARKER, D .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1955, 26 (05) :449-453

[7]

FURNAS TC, 1957, SINGLE CRYSTAL ORIEN

[8]

KLUG HP, 1954, XRAY DIFFRACTION PRO

[9] A new method of spectroscopy for faint x-radiations [J].

Ross, PA .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1928, 16 (06) :433-437

[10]

VERSCHOOR AC, 1963, PRIVATE COMMUNICATIO

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