ELECTRICAL PROPERTIES AND ANISOTROPY IN AMORPHOUS SI AND SI0.5 GE0.5 ALLOY

被引：42

作者：

HAUSER, JJ ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

PHYSICAL REVIEW B | 1973年 / 8卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.8.3817

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3817 / 3823

页数：7

共 20 条

[1] HOPPING CONDUCTIVITY IN DISORDERED SYSTEMS [J].

AMBEGAOKAR, V ;

HALPERIN, BI ;

LANGER, JS .

PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (08) :2612-+

[2]

Brodsky A.H., 1972, J NONCRYST SOLIDES, V8, P739, DOI [10.1016/0022-3093(72)90221-9, DOI 10.1016/0022-3093(72)90221-9]

[3] STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS SILICON FILMS [J].

BRODSKY, MH ;

TITLE, RS ;

WEISER, K ;

PETTIT, GD .

PHYSICAL REVIEW B, 1970, 1 (06) :2632-&

[4] ANISOTROPIC MICROSTRUCTURE IN EVAPORATED AMORPHOUS GERMANIUM FILMS [J].

CARGILL, GS .

PHYSICAL REVIEW LETTERS, 1972, 28 (21) :1372-&

[5] HIGH-RESOLUTION ELECTRON MICROSCOPE OBSERVATION OF VOIDS IN AMORPHOUS GE [J].

DONOVAN, TM ;

HEINEMAN.K .

PHYSICAL REVIEW LETTERS, 1971, 27 (26) :1794-&

[6] OPTICAL EVIDENCE FOR A NETWORK OF CRACKLIKE VOIDS IN AMORPHOUS GERMANIUM [J].

GALEENER, FL .

PHYSICAL REVIEW LETTERS, 1971, 27 (25) :1716-&

[7] SUBMICROSCOPIC-VOID RESONANCE - EFFECT OF INTERNAL ROUGHNESS ON OPTICAL ABSORPTION [J].

GALEENER, FL .

PHYSICAL REVIEW LETTERS, 1971, 27 (07) :421-&

[8] VARIABLE RANGE HOPPING IN A NONUNIFORM DENSITY OF STATES [J].

HAMILTON, EM .

PHILOSOPHICAL MAGAZINE, 1972, 26 (04) :1043-&

[9] ELECTRICAL AND STRUCTURAL-PROPERTIES OF AMORPHOUS GERMANIUM [J].

HAUSER, JJ ;

STAUDINGER, A .

PHYSICAL REVIEW B, 1973, 8 (02) :607-615

[10] ANISOTROPIC ELECTRICAL PROPERTIES OF AMORPHOUS GERMANIUM [J].

HAUSER, JJ .

PHYSICAL REVIEW LETTERS, 1972, 29 (08) :476-&

← 1 2 →