TEXTURE OF SURFACES CLEANED BY ION BOMBARDMENT AND ANNEALING

被引：138

作者：

HENZLER, M

机构：

来源：

SURFACE SCIENCE | 1970年 / 22卷 / 01期

关键词：

D O I：

10.1016/0039-6028(70)90019-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：12 / &

共 12 条

[1]

ARTHUR JR, PRIVATE COMMUNICATIO

[2]

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[3] APPLICATION OF THE ION BOMBARDMENT CLEANING METHOD TO TITANIUM, GERMANIUM, SILICON, AND NICKEL AS DETERMINED BY LOW-ENERGY ELECTRON DIFFRACTION [J].

FARNSWORTH, HE ;

SCHLIER, RE ;

GEORGE, TH ;

BURGER, RM .

JOURNAL OF APPLIED PHYSICS, 1958, 29 (08) :1150-1161

[4] ION BOMBARDMENT-CLEANING OF GERMANIUM AND TITANIUM AS DETERMINED BY LOW-ENERGY ELECTRON DIFFRACTION [J].

FARNSWORTH, HE ;

SCHLIER, RE ;

GEORGE, TH ;

BURGER, RM .

JOURNAL OF APPLIED PHYSICS, 1955, 26 (02) :252-253

[5] LEED-INVESTIGATION OF STEP ARRAYS ON CLEAVED GERMANIUM (111) SURFACES [J].

HENZLER, M .

SURFACE SCIENCE, 1970, 19 (01) :159-&

[6]

HENZLER M, TO BE PUBLISHED

[7] STRUCTURAL PROPERTIES OF CLEAVED SILICON AND GERMANIUM SURFACES [J].

LANDER, JJ ;

GOBELL, GW ;

MORRISON, J .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (08) :2298-+

[8]

MACRAE AU, 1964, J APPL PHYS, V35, P1629

[9]

MACRAE AU, 1966, SURF SCI, V4, P247

[10]

MULLER K, 1969, STRUCTURE CHEMISTRY, P35

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