PROBING THE WAVE PROPERTIES OF ELECTRONS AND MANIPULATING ATOMS AT SURFACES WITH THE SCANNING TUNNELING MICROSCOPE

被引:15
作者
AVOURIS, P
机构
[1] IBM Research Division, T. J. Watson Research Center, Yorktown Heights
关键词
D O I
10.1021/ar00042a002
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
[No abstract available]
引用
收藏
页码:159 / 165
页数:7
相关论文
共 36 条
[1]  
Ashcroft N.D.M., 1976, SOLID STATE PHYS
[2]   PROBING THE CHEMISTRY AND MANIPULATING SURFACES AT THE ATOMIC SCALE WITH THE STM [J].
AVOURIS, P ;
LYO, IW .
APPLIED SURFACE SCIENCE, 1992, 60-1 :426-436
[3]   SCANNING TUNNELING MICROSCOPE TIP SAMPLE INTERACTIONS - ATOMIC MODIFICATION OF SI AND NANOMETER SI SCHOTTKY DIODES [J].
AVOURIS, P ;
LYO, IW ;
HASEGAWA, Y .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1993, 11 (04) :1725-1732
[4]  
AVOURIS P, IN PRESS J VAC SCI B
[5]  
AVOURIS P, IN PRESS SCIENCE
[6]  
AVOURIS P, 1990, J PHYS CHEM-US, V94, P2247
[7]  
AVOURIS P, 1993, ATOMIC NANOMETER SCA
[8]   TUNNELLING FROM A MANY-PARTICLE POINT OF VIEW [J].
BARDEEN, J .
PHYSICAL REVIEW LETTERS, 1961, 6 (02) :57-&
[9]   DEMONSTRATION OF THE TUNNEL-DIODE EFFECT ON AN ATOMIC SCALE [J].
BEDROSSIAN, P ;
CHEN, DM ;
MORTENSEN, K ;
GOLOVCHENKO, JA .
NATURE, 1989, 342 (6247) :258-260
[10]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61