PREPARATION AND PROPERTIES OF VAPOR-DEPOSITED EPITAXIAL GAAS1-XPX USING ARSINE AND PHOSPHINE

被引:294
作者
TIETJEN, JJ
AMICK, JA
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D O I
10.1149/1.2424100
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:724 / &
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共 18 条
[1]   ETCHING OF DISLOCATIONS ON LOW-INDEX FACES OF GAAS [J].
ABRAHAMS, MS ;
BUIOCCHI, CJ .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (09) :2855-&
[2]  
ABRAHAMS MS, TO BE PUBLISHED
[3]  
AMICK JA, 1963, RCA REV, V24, P555
[4]   RECOMBINATION SCHEME + INTRINSIC GAP VARIATION IN GAAS1-XPX SEMICONDUCTORS FROM ELECTRON BEAM + P-N DIODE EXCITATION (77 + 300 DEGREES K E) [J].
CUSANO, DA ;
CARLSON, RO ;
FENNER, GE .
APPLIED PHYSICS LETTERS, 1964, 5 (07) :144-&
[5]  
FENNER GE, 1964, PHYS REV, V134, P1113
[6]  
FLICKER H, 1960, B AM PHYS SOC, V5, P407
[8]  
GOYDISH BL, TO BE PUBLISHED
[9]  
Hilsum C., 1961, SEMICONDUCTING 3 4 C, P167
[10]  
HOLONYAK N, 1962, METALLURGY SEMICONDU, P49