APPLICATIONS OF METALLIC SHADOW-CASTING TO MICROSCOPY

被引：231

作者：

WILLIAMS, RC

WYCKOFF, RWG

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1946年 / 17卷 / 01期

关键词：

D O I：

10.1063/1.1707630

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：23 / 33

页数：11

共 15 条

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[2] Interpretation of electron micrographs of silica surface replicas [J].

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[3] Electron microscopic determination of surface elevations and orientations [J].

Heidenreich, RD ;

Matheson, LA .

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[4]

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[5]

MAHL H, 1940, Z TECH PHYS, V21, P17

[6]

MAHL H, 1941, Z TECH PHYS, V22, P33

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[8] Surface replicas for use in the electron microscope [J].

Schaefer, VJ ;

Harker, D .

JOURNAL OF APPLIED PHYSICS, 1942, 13 (07) :427-433

[9] SURFACE REPLICAS FOR ELECTRON MICROSCOPY [J].

THOMASSEN, L ;

WILLIAMS, RC ;

WYCKOFF, RWG .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1945, 16 (06) :155-156

[10] The thickness of electron microscopic objects [J].

Williams, RC ;

Wyckoff, RWG .

JOURNAL OF APPLIED PHYSICS, 1944, 15 (10) :712-716

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