CRYSTAL STRUCTURE ANALYSIS FROM FINE STRUCTURE IN ELECTRON DIFFRACTION PATTERNS

被引:25
作者
COWLEY, JM
GOODMAN, P
REES, ALG
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关键词
D O I
10.1107/S0365110X57000031
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:19 / 25
页数:7
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共 22 条
[1]  
ALTHENHEIN HJ, 1954, Z PHYS, V139, P103
[2]  
ALTHENHEIN HJ, 1952, NATURWISSENSCHAFTEN, V39, P447
[3]  
BRILL R, 1948, Z ANORG CHEM, V257, P151
[4]   DESIGN OF A HIGH-RESOLUTION ELECTRON DIFFRACTION CAMERA [J].
COWLEY, JM ;
REES, ALG .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1953, 30 (02) :33-38
[5]   SECONDARY ELASTIC SCATTERING IN ELECTRON DIFFRACTION [J].
COWLEY, JM ;
REES, ALG ;
SPINK, JA .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1951, 64 (379) :609-619
[6]   STRUCTURE ANALYSIS OF SINGLE CRYSTALS BY ELECTRON DIFFRACTION .1. TECHNIQUES [J].
COWLEY, JM .
ACTA CRYSTALLOGRAPHICA, 1953, 6 (06) :516-521
[7]   REFRACTION EFFECTS IN ELECTRON DIFFRACTION [J].
COWLEY, JM ;
REES, ALG .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1947, 59 (332) :287-&
[8]   REFRACTION EFFECTS IN ELECTRON DIFFRACTION [J].
COWLEY, JM ;
REES, ALG .
NATURE, 1946, 158 (4016) :550-551
[9]  
HILLIER J, 1945, PHYS REV, V68, P98