SIMULTANEOUS THICKNESS AND GROUP INDEX MEASUREMENT USING OPTICAL LOW-COHERENCE REFLECTOMETRY

被引：107

作者：

SORIN, WV

GRAY, DF

机构：

[1] Hewlett-Packard Laboratories, Palo Alto

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1992年 / 4卷 / 01期

关键词：

D O I：

10.1109/68.124892

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Using high-resolution optical reflectometry, group index and physical thickness can both be determined by precisely measuring optical time delays through a sample. Optical low-coherence reflectometry offers both the high-spatial resolution and large dynamic range required to perform accurate measurements using this technique.

引用

页码：105 / 107

页数：3

共 7 条

[1]

BOHM R, 1990, 7TH P OPT FIB SENS C, P353

[2] ABSOLUTE OPTICAL RANGING USING LOW COHERENCE INTERFEROMETRY [J].