AVERAGING OF LOW EXPOSURE ELECTRON-MICROGRAPHS OF NON-PERIODIC OBJECTS

被引：109

作者：

FRANK, J ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 OHE,ENGLAND

来源：

关键词：

D O I：

10.1016/S0304-3991(75)80020-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：159 / 162

页数：4

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