PLASTIC-DEFORMATION OF NANOMETER-SCALE GOLD CONNECTIVE NECKS

被引：267

作者：

AGRAIT, N

RUBIO, G

VIEIRA, S

机构：

[1] Instituto Universitario de Ciencia de Materiales Nicols Cabrera Laboratorio de Bajas Temperaturas, C-III, Universidad Autnoma de Madrid

来源：

PHYSICAL REVIEW LETTERS | 1995年 / 74卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.74.3995

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A combined scanning force and tunneling microscope is used to study the plastic deformation of a connective neck of nanometer dimensions formed by cohesive bonding between metal tip and substrate after contact. The applied force and conductance of the neck are measured simultaneously during the deformation process, which proceeds in alternating elastic and yielding stages. From these data the Young's modulus and the yield stress of the neck are estimated. This is the first experimental quantitative measurement of plastic deformation in a structure of nanometer size. © 1995 The American Physical Society.

引用

页码：3995 / 3998

页数：4

共 28 条

[1] PLASTIC-DEFORMATION IN ATOMIC SIZE CONTACTS [J].

AGRAIT, N ;

RODRIGO, JG ;

RUBIO, G ;

SIRVENT, C ;

VIEIRA, S .

THIN SOLID FILMS, 1994, 253 (1-2) :199-203

[2] ATOMIC-SCALE CONNECTIVE NECK FORMATION AND CHARACTERIZATION [J].

AGRAIT, N ;

RODRIGO, JG ;

SIRVENT, C ;

VIEIRA, S .

PHYSICAL REVIEW B, 1993, 48 (11) :8499-8501

[3] CONDUCTANCE STEPS AND QUANTIZATION IN ATOMIC-SIZE CONTACTS [J].

AGRAIT, N ;

RODRIGO, JG ;

VIEIRA, S .

PHYSICAL REVIEW B, 1993, 47 (18) :12345-12348

[4]

[Anonymous], 1992, INTERMOLECULAR SURFA

[5] WORK-FUNCTION ANISOTROPIES AS AN ORIGIN OF LONG-RANGE SURFACE FORCES [J].

BURNHAM, NA ;

COLTON, RJ ;

POLLOCK, HM .

PHYSICAL REVIEW LETTERS, 1992, 69 (01) :144-147

[6] PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].

BURNHAM, NA ;

DOMINGUEZ, DD ;

MOWERY, RL ;

COLTON, RJ .

PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934

[7] POINT-CONTACT SPECTROSCOPY [J].

DUIF, AM ;

JANSEN, AGM ;

WYDER, P .

JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (20) :3157-3189

[8] TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY [J].

GIMZEWSKI, JK ;

MOLLER, R .

PHYSICAL REVIEW B, 1987, 36 (02) :1284-1287

[9] POINT-CONTACT SPECTROSCOPY IN METALS [J].

JANSEN, AGM ;

VANGELDER, AP ;

WYDER, P .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (33) :6073-6118

[10]

Johnson K. L., 1987, CONTACT MECH, DOI DOI 10.1017/CBO9781139171731

← 1 2 3 →