RELIABILITY EVALUATION - COMPARATIVE STUDY OF DIFFERENT TECHNIQUES

被引：49

作者：

AGGARWAL, KK

MISRA, KB

GUPTA, JS

机构：

[1] UNIV ROORKEE,ROORKEE,INDIA

[2] REG ENGN COLL KURUKSHETRA,KURUKSHETRA,INDIA

来源：

MICROELECTRONICS AND RELIABILITY | 1975年 / 14卷 / 01期

关键词：

D O I：

10.1016/0026-2714(75)90461-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：49 / 56

页数：8

共 15 条

[1]

AGGARWAL K, TO BE PUBLISHED

[2] NEW METHOD FOR SYSTEM RELIABILITY EVALUATION [J].

AGGARWAL, KK ;

GUPTA, JS ;

MISRA, KB .

MICROELECTRONICS AND RELIABILITY, 1973, 12 (05) :435-440

[3]

[Anonymous], 1968, PROBABILISTIC RELIAB

[4]

Bazovsky Igor, 1961, RELIABILITY THEORY P

[5]

BROWN DB, 1971, IEEE T RELIAB, VR 20, P121

[6]

HURLEY RB, 1963, IEEE T RELIAB, VR 12, P39

[7]

JENSEN PA, 1969, IEEE T RELIAB, VR 18, P169

[8]

KIM YH, 1972, IEEE T RELIAB, VR 21, P215

[9]

KRISHNAMURTHY EV, 1972, IEEE T RELIAB, VR 21, P86, DOI 10.1109/TR.1972.5215951

[10]

LOCKS MO, 1971, IEEE T RELIAB, VR 20, P231