TUNNELING MICROSCOPY AND SPECTROSCOPY OF SEMICONDUCTOR SURFACES AND INTERFACES

被引：46

作者：

BARATOFF, A

BINNIG, G

FUCHS, H

SALVAN, F

STOLL, E

机构：

来源：

SURFACE SCIENCE | 1986年 / 168卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(86)90905-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：734 / 743

页数：10

共 36 条

[1]

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[2] SCANNING TUNNELING MICROSCOPY OF SEMICONDUCTOR SURFACES [J].

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[3] THEORY OF SCANNING TUNNELING MICROSCOPY METHODS AND APPROXIMATIONS [J].

BARATOFF, A .

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[4]

BARATOFF A, 1983, EUR C ABSTR B, V7, P369

[5] REAL-SPACE OBSERVATION OF SURFACE-STATES ON SI(111)7X7 WITH THE TUNNELING MICROSCOPE [J].

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[6]

BINNIG G, 1984, PHYSICA B & C, V127, P37, DOI 10.1016/S0378-4363(84)80008-X

[7] ELECTRON METAL-SURFACE INTERACTION POTENTIAL WITH VACUUM TUNNELING - OBSERVATION OF THE IMAGE FORCE [J].

BINNIG, G ;

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FLORES, F .

PHYSICAL REVIEW B, 1984, 30 (08) :4816-4818

[8]

BINNIG G, 1985, SURF SCI, V157, pL373, DOI 10.1016/0039-6028(85)90666-1

[9] TUNNELING SPECTROSCOPY AND INVERSE PHOTOEMISSION - IMAGE AND FIELD STATES [J].

BINNIG, G ;

FRANK, KH ;

FUCHS, H ;

GARCIA, N ;

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[10] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123

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