EFFECT OF VARIATIONS IN OBJECTIVE FOCAL LENGTH ON ELECTRON-MICROSCOPE PERFORMANCE

被引:4
作者
LOVELL, DJ
CHAPMAN, SK
机构
[1] GUYS HOSP, SCH MED, DEPT ANAT, EM UNIT, LONDON SE1 9RT, ENGLAND
[2] PERKIN ELMER LTD EM APPL LAB, BEACONSFIELD HP9 1QA, BUCKINGHAMSHIRE, ENGLAND
关键词
D O I
10.1111/j.1365-2818.1975.tb04060.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:277 / 282
页数:6
相关论文
共 7 条
[1]  
AGAR AW, 1974, PRACTICAL METHODS EL, P168
[2]  
HAINE ME, 1954, J APPL CRYSTALLOGR, V1, P1
[3]   A TEST OBJECT AND CRITERIA FOR HIGH RESOLUTIONELECTRON MICROSCOPY [J].
HEIDENRE.RD ;
HESS, WM ;
BAN, LL .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 :1-&
[4]  
LEPOOLE JB, 1954, 3RD P INT C EL MICR, P666
[5]  
SHIROTA K, 1972, 5 P H EUR C EL MICR, P122
[6]   DISTORTION-FREE LOW-MAGNIFICATION STAGE FOR HITACHI HU-11B ELECTRON-MICROSCOPE [J].
THOMPSON, DW ;
CHAPMAN, SK ;
HEAP, PF .
JOURNAL OF MICROSCOPY, 1971, 94 (DEC) :259-+
[7]  
P236 KOD PUBL