GROUP TESTING TO ELIMINATE EFFICIENTLY ALL DEFECTIVES IN A BINOMIAL SAMPLE

被引：235

作者：

SOBEL, M

GROLL, PA

机构：

来源：

BELL SYSTEM TECHNICAL JOURNAL | 1959年 / 38卷 / 05期

关键词：

D O I：

10.1002/j.1538-7305.1959.tb03914.x

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：1179 / 1252

页数：74

相关论文

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