SURFACE MEASUREMENTS ON FRESHLY CLEAVED SILICON PARA-NORMAL JUNCTIONS

被引：90

作者：

GOBELI, GW

ALLEN, FG

机构：

来源：

关键词：

D O I：

10.1016/0022-3697(60)90201-8

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：23 / &

共 5 条

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[2] WORK FUNCTION AND EMISSION STUDIES ON CLEAN SILICON SURFACES [J].

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SCHLIER, RE ;

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BURGER, RM .

[4] EFFECTS OF ENVIRONMENT ON THE FRACTURE BEHAVIOR OF GERMANIUM [J].

JOHNSTON, TL ;

STOKES, RJ ;

LI, CH .

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[5]

Simon R.E., 1959, B AM PHYS SOC, V4, P410