Fourier analysis of X-ray patterns of soda-silica glass

被引：230

作者：

Warren, BE ^{[1
]}

Biscoe, J ^{[1
]}

机构：

[1] Massachusetts Inst Technol, Dept Phys, Cambridge, MA USA

来源：

关键词：

D O I：

10.1111/j.1151-2916.1938.tb15774.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：259 / 265

页数：7

共 5 条

[1]

Bragg W.L., 1937, ATOMIC STRUCTURE MIN

[2]

COMPTON AH, 1935, XRAYS THEORY EXPT, P781

[3] X-ray diffraction study of the structure of soda-silica glass [J].

Warren, BE ;

Loring, AD .

[4] Fourier analysis of X-ray patterns of vitreous SiO2 and B(2)O3 [J].

Warren, BE ;

Krutter, H ;

Morningstar, O .

[5] The structure of silica glass by X-ray diffraction studies [J].

Warren, BE ;

Biscoe, J .