DIGITAL SIGNAL PROCESSOR CONTROL OF SCANNED PROBE MICROSCOPES

被引：33

作者：

BASELT, DR

CLARK, SM

YOUNGQUIST, MG

SPENCE, CF

BALDESCHWIELER, JD

机构：

[1] CALTECH,DIV CHEM,PASADENA,CA 91125

[2] CALTECH,DIV BIOL,PASADENA,CA 91125

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 07期

关键词：

D O I：

10.1063/1.1144462

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Digital signal processors have made it possible to control scanned probe microscopes using straightforward software emulations of analog circuits. Using a system consisting of a commercially available digital signal processor board interfaced to analog I/0, we have developed algorithms for self-optimizing feedback, raster generation (with hysteresis correction, sample tilt compensation, and scan rotation), lock-in detection, and automatic tip-sample approach. We also discuss an instruction parser that takes advantage of the digital architecture to allow automatic operation for extended periods.

引用

收藏

页码：1874 / 1882

页数：9

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