NEW TECHNIQUE FOR INVESTIGATING NONCRYSTALLINE STRUCTURES - FOURIER ANALYSIS OF EXTENDED X-RAY - ABSORPTION FINE STRUCTURE

被引:1229
作者
SAYERS, DE
STERN, EA
LYTLE, FW
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D O I
10.1103/PhysRevLett.27.1204
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O4 [物理学];
学科分类号
0702 ;
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页码:1204 / &
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共 19 条
[1]   THEORY OF EXTENDED FINE STRUCTURE OF X-RAY ABSORPTION EDGES [J].
AZAROFF, LV .
REVIEWS OF MODERN PHYSICS, 1963, 35 (04) :1012-&
[2]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[3]   Fine structure in X-ray absorption spectra [J].
Hanawalt, JD .
JOURNAL OF THE FRANKLIN INSTITUTE, 1932, 214 :569-584
[4]  
HANAWALT JD, 1930, Z PHYS, V70, P293
[5]  
HEIDENREICH RD, 1964, FUNDAMENTALS TRANSMI, P45
[6]   ATOMIC ARRANGEMENT IN VITREOUS SELENIUM [J].
KAPLOW, R ;
ROWE, TA ;
AVERBACH, BL .
PHYSICAL REVIEW, 1968, 168 (03) :1068-&
[7]  
LIGHT TB, 1969, PHYS REV LETT, V22, P1058
[8]  
Lytle F., 1966, ADV X-RAY ANAL, V9, P398
[9]  
LYTLE FW, 1963, DEV APPLIED SPECTROS, V2, P285
[10]  
MOSS SC, 1970, 10TH P INT C PHYS SE, P658