Electron diffraction studies of thin films - I - Structure of very thin films

被引：64

作者：

Germer, LH ^{[1
]}

机构：

[1] Bell Tel Labs, New York, NY USA

来源：

PHYSICAL REVIEW | 1939年 / 56卷 / 01期

关键词：

D O I：

10.1103/PhysRev.56.58

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：58 / 71

页数：14

共 17 条

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[10]

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