X-RAY PHOTOELECTRON SPECTROMETER DESIGNED FOR SURFACE RESEARCH

被引：18

作者：

FRASER, WA ^{[1
]}

FLORIO, JV ^{[1
]}

DELGASS, WN ^{[1
]}

ROBERTSON, WD ^{[1
]}

机构：

[1] YALE UNIV, DEPT ENGN & APPL SCI, NEW HAVEN, CT 06520 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 10期

关键词：

D O I：

10.1063/1.1685981

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1490 / 1496

页数：7

共 26 条

[1] DETERMINATION OF ELECTRON ESCAPE DEPTH IN GOLD BY MEANS OF ESCA [J].

BAER, Y ;

HEDEN, PF ;

HEDMAN, J ;

KLASSON, M ;

NORDLING, C .

SOLID STATE COMMUNICATIONS, 1970, 8 (18) :1479-&

[2] SURFACE SENSITIVITY OF ESCA FOR SUB-MONOLAYER QUANTITIES OF MERCURY ADSORBED ON A GOLD SUBSTRATE [J].

BRUNDLE, CR ;

ROBERTS, MW .

CHEMICAL PHYSICS LETTERS, 1973, 18 (03) :380-381

[3] SOME OBSERVATIONS ON SURFACE SENSITIVITY OF PHOTOELECTRON SPECTROSCOPY [J].

BRUNDLE, CR ;

ROBERTS, MW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1972, 331 (1586) :383-394

[4] HOT ELECTRON SCATTERING AND OPTICAL DENSITY OF STATES OF YTTRIUM [J].

EASTMAN, DE .

SOLID STATE COMMUNICATIONS, 1970, 8 (01) :41-&

[5] CONTACT-POTENTIAL MEASUREMENTS OF ADSORPTION OF CS O2 AND H2 ON (110) TA [J].

FEHRS, DL ;

STICKNEY, RE .

SURFACE SCIENCE, 1967, 8 (03) :267-&

[6] DETERMINATION OF SEMICONDUCTOR SURFACE PROPERTIES BY MEANS OF PHOTOELECTRIC EMISSION [J].

FISCHER, TE .

SURFACE SCIENCE, 1969, 13 (01) :30-&

[7] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J].

FRASER, WA ;

FLORIO, JV ;

DELGASS, WN ;

ROBERTSON, WD .

SURFACE SCIENCE, 1973, 36 (02) :661-674

[8]

FRASER WA, 1972, THESIS YALE U

[9] ENHANCEMENT OF SENSITIVITY IN ESCA SPECTROMETERS [J].

HELMER, JC ;

WEICHERT, NH .

APPLIED PHYSICS LETTERS, 1968, 13 (08) :266-&

[10]

HENKE BL, 1969, ADVAN XRAY ANAL, V12, P480

← 1 2 3 →