RAMAN-SCATTERING STUDY OF ION-IMPLANTED AND CW-LASER ANNEALED POLYCRYSTALLINE SILICON

被引:31
作者
NAKASHIMA, S [1 ]
OIMA, S [1 ]
MITSUISHI, A [1 ]
NISHIMURA, T [1 ]
FUKUMOTO, T [1 ]
AKASAKA, Y [1 ]
机构
[1] MITSUBISHI ELECT CORP,LSI RES & DEV LAB,ITAMI,HYOGO 664,JAPAN
关键词
D O I
10.1016/0038-1098(81)90825-5
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:765 / 768
页数:4
相关论文
共 8 条
[1]   EFFECT OF STATIC UNIAXIAL STRESS ON RAMAN SPECTRUM OF SILICON [J].
ANASTASSAKIS, E ;
PINCZUK, A ;
BURSTEIN, E ;
POLLAK, FH ;
CARDONA, M .
SOLID STATE COMMUNICATIONS, 1970, 8 (02) :133-+
[2]  
Baumgart H., 1980, Journal of the Physical Society of Japan, V49, P1291
[3]   RAMAN-SCATTERING FROM BORON-IMPLANTED LASER-ANNEALED SILICON [J].
ENGSTROM, H ;
BATES, JB .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (04) :2921-2925
[4]   POLYCRYSTALLINE SILICON FILMS DEPOSITED IN A GLOW-DISCHARGE AT TEMPERATURES BELOW 250-DEGREES-C [J].
IQBAL, Z ;
WEBB, AP ;
VEPREK, S .
APPLIED PHYSICS LETTERS, 1980, 36 (02) :163-165
[5]  
KANELLIS G, 1980, PHYS REV B, V21, P1534
[6]   RAMAN STUDY OF LASER ANNEALED SILICON [J].
MORHANGE, JF ;
KANELLIS, G ;
BALKANSKI, M .
SOLID STATE COMMUNICATIONS, 1979, 31 (11) :805-808
[7]  
MORHANGE JF, 1978, P LASER SOLID INTERA, P429
[8]  
NISHIMURA T, UNPUBLISHED