VOLTAGE DUE TO THERMAL NOISE IN DC JOSEPHSON EFFECT

被引：1065

作者：

AMBEGAOKAR, V

HALPERIN, BI

机构：

[1] Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca

[2] Bell Telephone Laboratories, Murray Hill

来源：

PHYSICAL REVIEW LETTERS | 1969年 / 22卷 / 25期

关键词：

D O I：

10.1103/PhysRevLett.22.1364

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The effects of thermal fluctuations on the dc Josephson effect in a junction of small capacitance are calculated using an analogy with the Brownian motion of a particle in a field of force. The results are presented in a form suitable for comparison with experiment. © 1969 The American Physical Society.

引用

页码：1364 / +

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