RELATION BETWEEN NICKEL CRYSTALLINE-STRUCTURES AND THEIR ELECTROCATALYTIC PROPERTIES .1. DETERMINATION OF STRUCTURAL CHARACTERISTICS OF NICKEL ELECTRODES OBTAINED BY VACUUM DEPOSITION

被引：18

作者：

ANGELY, L

BRONOEL, G

PESLERBE, G

机构：

[1] Laboratoire d'Electrolyse, C.N.R.S. Meudon

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1979年 / 96卷 / 02期

关键词：

D O I：

10.1016/S0022-0728(79)80375-7

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Different nickel configurations need to be defined and characterized. These different structures are obtained by vacuum deposition on several substrates. Apart from the nature of substrate, the influence of deposit and annealing temperature have been studied. We observe that the variations of the nickel structure concern: unit cell, diameter and shape of the crystallites, crystallization facies, stacking faults, microvacancies, vacancies, etc. Four films are described in detail. © 1979 Elsevier Sequoia S.A.

引用

页码：183 / 190

页数：8

共 14 条

[1]

Anderson J. R., 1971, CHEMISORPTION REACTI

[2]

ANGELY L, 1978, CR ACAD SCI C CHIM, V286, P307

[3]

[Anonymous], 1975, STRUCTURE METALLIC C

[4]

Bykov V. N., 1975, Soviet Physics - Crystallography, V19, P558

[5]

DANTONIO C, 1963, T METALL SOC AIME, V227, P1346

[6] ORIGINS OF STRESS IN THIN NICKEL FILMS [J].

DOLJACK, FA ;

HOFFMAN, RW .

THIN SOLID FILMS, 1972, 12 (01) :71-&

[7]

Fuks M. Ya., 1969, Fizika Metallov i Metallovedenie, V28, P645

[8] STRAIN-RELAXATION IN THIN-FILMS ON SUBSTRATES [J].

GANGULEE, A .

ACTA METALLURGICA, 1974, 22 (02) :177-183

[9]

Gol'diner M. G., 1976, Soviet Physics - Solid State, V17, P1234

[10] MECHANICAL PROPERTIES OF THIN NICKEL FILMS [J].

GRUNES, RL ;

DANTONIO, C ;

KIES, FK .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (09) :2735-&

← 1 2 →