SURFACE STATES AND 1/F NOISE IN MOS TRANSISTORS

被引:52
作者
ABOWITZ, G
ARNOLD, E
LEVENTHA.EA
机构
关键词
D O I
10.1109/T-ED.1967.16105
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:775 / +
页数:1
相关论文
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[2]   HALL MEASUREMENTS ON SILICON FIELD EFFECT TRANSISTOR STRUCTURES [J].
FOWLER, AB ;
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FANG, F .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1964, 8 (04) :427-&
[3]  
MANY A, 1965, SEMICONDUCTOR SURFAC, P150
[4]   EVIDENCE OF SURFACE ORIGIN OF 1/F NOISE [J].
SAH, CT ;
HIELSCHER, F .
PHYSICAL REVIEW LETTERS, 1966, 17 (18) :956-+